Materials Properties Ⅱ

Course Information

College	Toyama College	Year	2022
Course Title	Materials Properties Ⅱ
Course Code	0136	Course Category	Specialized / Elective
Class Format	Lecture	Credits	Academic Credit: 2
Department	Department of Mechanical Engineering	Student Grade	5th
Term	Second Semester	Classes per Week	2
Textbook and/or Teaching Materials
Instructor	Kita Masao

Course Objectives

As a basic knowledge in solid physics, the goal is to understand and explain the following items.
· Temperature dependence of electrical resistance of extrinsic semiconductor
· Hall effect measurement
· Crystal structure factor
· Calculation method of diffraction intensity of body-centered and face-centered cubic lattice

Rubric

	Ideal Level of Achievement	Standard Level of Achievement	Unacceptable Level of Achievement)
Evaluation 1	It is possible to explain the temperature dependence of electrical resistance of extrinsic semiconductor perfectly	It is possible to explainthe temperature dependence of electrical resistance of extrinsic semiconductor	It is impossible to explain the temperature dependence of electrical resistance of extrinsic semiconductor
Evaluation 2	Understand the Hall effect measurement perfectly	Understand the Hall effect measurement	Misunderstand the Hall effect measurement
Evaluation 3	Students can explain X-ray diffraction and structure factor perfectly	Students can correctly explain X-ray diffractions and structure factors	Students can not explain X-ray diffraction and structure factor
Evaluation 4	Students can explain the electronic structure of semiconductors perfectly	Students can correctly explain the electronic structure of semiconductors	Students can not explain the electronic structure of semiconductors

Assigned Department Objectives

Learning and Educational Objectives of the “General Engineering” A-2 （設計・システム，情報・論理，材料・バイオ，力学，社会技術に関する基礎知識を理解し，簡単に説明することができる。）

JABEE 1(2)(d)(1) （専門工学（工学（融合複合・新領域）における専門工学の内容は申請高等教育機関が規定するものとする）の知識と能力）

JABEE 1(2)(d)(2) （いくつかの工学の基礎的な知識・技術を駆使して実験を計画・遂行し、データを正確に解析し、工学的に考察し、かつ説明・説得する能力）

JABEE 2.1(1) （基礎工学として、①設計・システム系科目群、②情報・論理系科目群、③材料・バイオ系科目群、④力学系科目群、⑤社会技術系科目群の５群からなり、各群から少なくとも１科目、合計最低６科目を含むこと。）

Diploma policy 1 （To develop engineers who comprehensively acquire knowledge, focusing on mechanical engineering as the basis of manufacturing and production technology, and play a role in equipment design, technology development and other engineering-related fields.）

Teaching Method

Outline:

Students will learn the X-ray diffraction method, which is one of the methods for evaluating crystal structures.
Students will learn about the electrical properties and electronic structures of semiconductors used in computers, cellular phones, and LEDs.

Style:

Evaluate the student’s degree of comprehension according to the form of lecture and exercise, and in principle proceed according to the lesson plans.
(May sometimes change according to student’s degree of understanding.)

Notice:

Can take makeup exam in need aid up to maximum of 60 points.

Course Plan

			Theme	Goals
2nd Semester
	3rd Quarter
		1st	Guidance How to proceed with this lecture Review on materials science	Explain the role of "solid" in materials science
		2nd	n-type semiconductor and p-type semiconductor	It is possible to explain n-type semiconductor and p-type semiconductor
		3rd	Temperature dependence of electrical resistance of extrinsic semiconductor	It is possible to explain the temperature dependence of electrical resistance of extrinsic semiconductor
		4th	Defective semiconductor	It is possible to describe the defective semiconductor
		5th	Law of mass action	It is possible to explain the Law of mass action
		6th	Hall effect measurement	It is possible to explain Hall effect measurement
		7th	Applications using pn junctions	It is possible to explain applications using pn junctions
		8th	Midterm exam
	4th Quarter
		9th	X-ray	Understand the type of radiation, its effects on human bodies, and related laws and regulations
		10th	X-ray diffraction 1	It is possible to calculate the lattice parameter from the spacing d between adjacent (hkℓ) lattice planes
		11th	X-ray diffraction 2	It is possible to explain the structure factor
		12th	X-ray diffraction 3	It is possible to calculate the systematic absences
		13th	X-ray diffraction 4	It is possible to calculate the systematic absences
		14th	X-ray diffraction 5	It is possible to calculate the intensity of X ray diffraction
		15th	Final exam
		16th	Return exam papers Explanation of exam Class questionnaire

Evaluation Method and Weight (%)

	Examination	Portfolio	Total
Subtotal	60	40	100
Basic Ability	40	20	60
Technical Ability	20	20	40